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Hardware
Safety Advice
KLIPPEL Analyzer Hardware
Example Speaker
Micro Speaker Clamping
MUX – Multiplexer
NFS – Near Field Scanner Baffle - Assembly
NFS – Near Field Scanner - Assembly
Pro Driver Stand
Pro Driver Stand Locking Bolt Modification
SCN-NF – SCN Near Field Add-On - Assembly
Vacuum Stand
dB-Lab – Software
dB-Lab
QC – Quality Control
QC – Quality Control
ALD – Air Leak Detection
ALS – Air Leak Stethoscope
BAC – Balanced Armature Check
EQA – Equalization + Alignment
EXD – External Devices
IMP – Impedance
I/O & Prompt
LST – Linear Suspension Test
MSC – Motor and Suspension Check
MTD – Multi-Tone Distortion
PP – Post Processing Task
Preconditioning
SAN – Spectrum Analysis
SPL – Sound Pressure
SPL+IMP – Sound Pressure + Impedance
3DL – 3D Limits
DCX – DC Measurement of Excursion
Feature Libraries
MSP – Match Speaker Tool
PNI – Production Noise Immunity
QC-VC – QC Verdict Collector
STAT – Statistics
SYN – External Synchronization
Transducer Parameter Identification Modules
BAC – Balanced Armature Check
IMP – Impedance
FLSI – Fast Large Signal Identification
LPM – Linear Parameter Measurement
LSI – Large Signal Identification
LSI3 – Large Signal Identification
MMT – Multipoint Measurement Tool
MSC – Motor and Suspension Check
Frequency Response & Distortion Modules
3DL – 3D Limits
ALD – Air Leak Detection
ALS – Air Leak Stethoscope
DIS – Distortion
EQA – Equalization + Alignment
ISC – In-Situ Room Compensation
MTD – Multi-Tone Distortion
MTON – Multi-Tone Measurement
NRL – Nonlinear Residual Analyzer
PNI – Production Noise Immunity
SAN – Spectrum Analysis
SPL – Sound Pressure
SPL+IMP – Sound Pressure + Impedance
SYN – External Synchronization
TBM – Tone Burst Measurement
TRF – Transfer Function Measurement
Scanning Vibrometer & Part Measurement
BFS – B-Field Scanner
LST – Linear Suspension Test
MPM – Material Parameter Measurement
MSPM – Micro Suspension Part Measurement
Poly2SCN – Interface
RMA – Rocking Mode Analysis
SCN – Scanning Vibrometer
SPM – Suspension Part Measurement
Directivity & Room Correction
NFS – Near Field Scanner
SCN-NF – SCN Near Field Add-On
Simulation & Auralisation Modules
AUR – Auralization
LSIM – Linear Simulation
SIM – Simulation
SIM-AUR – Nonlinear Simulation and Auralization
Endurance Test
KET – Klippel Endurance Test
KET – Calibration
PWT – Power Test
KCS – Klippel Controlled Sound
KCS Monitor
KCS-ID – Parameter Identification
KCS Evaluation Tutorials
Tools
Automation
dB extract – Data Extraction
DOC – Documentation
Robotics
PPP – Programmable Post-Processing
STAT – Statistics
TFA – Time Frequency Analysis
Utilities
DCX – DC Measurement of Excursion
EXD – External Devices
Feature Libraries
I/O & Prompt
MSP – Match Speaker Tool
PP – Post Processing Task
Preconditioning
QC-VC – QC Verdict Collector
Contact and Support
Index
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